How I customize self attention layer for identifying wafer defects?
13 visualizaciones (últimos 30 días)
Mostrar comentarios más antiguos
Sharith Dhar
el 13 de Jul. de 2024
Comentada: Sharith Dhar
el 15 de Jul. de 2024
how I used customize multi head self attention in the CNN network for detecting wafer defects ? please explain with example
0 comentarios
Respuesta aceptada
Shantanu Dixit
el 15 de Jul. de 2024
Hi Sharith,
It is my understanding that you want to add and customize self-attention in the CNN network for detecting wafer defects.
You can define a CNN-based architecture and add a self-attention layer in the end using ‘selfAttentionLayer’. The function takes in two parameters, i.e, ‘NumHeads’ and ‘NumKeyChannels’ using which you can change the number of heads and the dimensions of key vector.
Below is a reference code for the model architecture:
layers = [
imageInputLayer([28 28 1], 'Name', 'input')
convolution2dLayer(3, 16, 'Padding', 'same', 'Name', 'conv1')
batchNormalizationLayer('Name', 'bn1')
reluLayer('Name', 'relu1')
maxPooling2dLayer(2, 'Stride', 2, 'Name', 'maxpool1')
convolution2dLayer(3, 32, 'Padding', 'same', 'Name', 'conv2')
batchNormalizationLayer('Name', 'bn2')
reluLayer('Name', 'relu2')
flattenLayer('Name', 'flatten')
selfAttentionLayer(4, 32, 'Name', 'self_attention')
fullyConnectedLayer(10, 'Name', 'fc')
softmaxLayer('Name', 'softmax')
classificationLayer('Name', 'output')
];
The above code defines a CNN based architecture incorporating Multi headed self-attention (MHSA) for ten class classification.
Refer to the below MathWorks documentation for more information:
Más respuestas (0)
Ver también
Categorías
Más información sobre Image Data Workflows en Help Center y File Exchange.
Community Treasure Hunt
Find the treasures in MATLAB Central and discover how the community can help you!
Start Hunting!